Hirayama Seisakusho Co., a leading provider of testing equipment, showcased their innovative HAST System at NEPCON Japan 2024. The HAST apparatus, also known as the Highly Accelerated Life Test Apparatus, is designed to evaluate the humidity resistance of semiconductor components. By utilizing a pressure vessel, the test time is significantly shortened from 10 years to just a few hundred hours. The device features a touch panel with a temperature display, allowing users to easily adjust settings and input test conditions. The automatic lock button on the door ensures convenient operation. With its advanced capabilities, the HAST System is set to revolutionize the evaluation of moisture resistance in the industry.Generated by OpenAI
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